Atomic force microscopy (AFM) provides a method for detecting nanoscale structural information. First, this review explains the fundamentals of AFM, including principle, manipulation, and analysis. Applications of AFM are then reported in food science and technology research, including qualitative macromolecule and polymer imaging, complicated or quantitative structure analysis, molecular inter...

The nanoscale surface analysis of microbial cells represents a significant challenge of current microbiology and is critical for developing new biotechnological and biomedical applications. Using atomic force microscopy (AFM) topographic imaging, researchers can visualize the ultrastructure of live cells under physiological conditions and their subtle modifications upon cell growth or treatment...

Atomic force microscopy-based infrared spectroscopy (AFM-IR) is a rapidly emerging technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. AFM-IR works by using the tip of an AFM probe to locally detect thermal expansion in a sample resulting from absorption of infrared radiation. AFM-IR thus can provide the ...

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Current advancements in nanotechnology are dependent on the capabilities that can enable nano-scientists to extend their eyes and hands into the nano-world. For this purpose, a haptics (devices capable of recreating tactile or force sensations) based system for AFM (Atomic Force Microscope) is proposed. The system enables the nano-scientists to touch and feel the sample surfaces, viewed through...

The analysis of the static deflection of cantilever plates is of fundamental importance in application to the atomic force microscope (AFM). In this paper we present a detailed theoretical study of the deflection of such cantilevers. This~ shall incorporate the presentation of approximate analytical methods applicable in the analysis of arbitrary cantilevers, and a discussion of their limitatio...

Atomic force microscopy (AFM) is a powerful and versatile tool for probing the mechanical properties of biological samples. This chapter describes the procedures for using AFM indentation to measure the elastic moduli of living cells. We include step-by-step instructions for cantilever calibration and data acquisition using a combined AFM/optical microscope system, as well as a detailed protoco...

A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈ 100 K to room temperature. AFM operation above room temperature is also possibl...